P/EN/30. Multiple design parameters and the yield stress

The paper examines the relationship between the room temperature yield pressure of InxGa1-xAs superlattices measured by nanoindentation and the volume averaged strain modulation. The dependence of the yield stress on multiple design parameters is studied indicating the simultaneous onset of plastic deformation across a finite volume. Conclusions are made about the relationship which exists with yield decreasing in response to increased strain modulation.